Self-testing digital-to-analog converter
One embodiment of the invention includes a digital-to-analog converter (DAC) circuit. The DAC circuit includes a DAC portion configured to generate an output voltage having a magnitude that varies based on a plurality of digital values of a digital input signal. The DAC circuit also includes a test...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | One embodiment of the invention includes a digital-to-analog converter (DAC) circuit. The DAC circuit includes a DAC portion configured to generate an output voltage having a magnitude that varies based on a plurality of digital values of a digital input signal. The DAC circuit also includes a test portion configured to compare the output voltage with a predetermined test voltage for each of the plurality of digital values of the digital input signal during a test mode. The test portion can provide a digital output signal corresponding to one of acceptance and failure of the DAC circuit. |
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