Determining a characteristic of atomic particles affecting a programmable logic device

Determining a characteristic of atomic particles affecting a programmable logic device

Methods and systems are provided for determining a characteristic of an atomic particle affecting a programmable logic device (PLD). The PLD is configured to generate a value at one or more outputs. A source generates a packet of atomic particles. The departure from the source is indicated for the p...

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Bibliographische Detailangaben
Hauptverfasser: Bialke, Nathan J, Lesea, Austin H, Margolese, Michael A, Matteis, Raymond J
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Methods and systems are provided for determining a characteristic of an atomic particle affecting a programmable logic device (PLD). The PLD is configured to generate a value at one or more outputs. A source generates a packet of atomic particles. The departure from the source is indicated for the packet of the atomic particles. The PLD is impacted with the packet of the atomic particles. A change is detected in the value of one or more outputs of the PLD. The change in the value of the output or outputs is a result of the impact of the PLD by one of the atomic particles from the packet. A time interval is determined between the departure of the packet of the atomic particles from the source and the change in the value of the output or outputs.