Test and diagnosis of semiconductors
A method and system for performing diagnosing in an automatic test environment. The method begins by determining a fail condition during a test of a device under test (DUT). A diagnostic suite is determined for testing the fail condition. The diagnostic suite is generated if the diagnostic suite is...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A method and system for performing diagnosing in an automatic test environment. The method begins by determining a fail condition during a test of a device under test (DUT). A diagnostic suite is determined for testing the fail condition. The diagnostic suite is generated if the diagnostic suite is not available for access. |
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