Method and apparatus for providing SEU-tolerant circuits
The invention provides circuits that are tolerant to soft errors, such as a single event upset (SEU). The circuits have a chain of permitted state changes. Redundant elements, including redundant literals and assignments, are designed and implemented in the circuit. The design is such that a disrupt...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention provides circuits that are tolerant to soft errors, such as a single event upset (SEU). The circuits have a chain of permitted state changes. Redundant elements, including redundant literals and assignments, are designed and implemented in the circuit. The design is such that a disruption or change of state on a single element by an SEU will not change the state flow of a circuit or lead to impermissible state changes. In one embodiment, the invention is implemented in quasi-delay-insensitive (QDI) asynchronous circuits. |
---|