Method and apparatus for providing SEU-tolerant circuits

The invention provides circuits that are tolerant to soft errors, such as a single event upset (SEU). The circuits have a chain of permitted state changes. Redundant elements, including redundant literals and assignments, are designed and implemented in the circuit. The design is such that a disrupt...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Martin, Alain J, Jang, Wonjin, Nystroem, Mika
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The invention provides circuits that are tolerant to soft errors, such as a single event upset (SEU). The circuits have a chain of permitted state changes. Redundant elements, including redundant literals and assignments, are designed and implemented in the circuit. The design is such that a disruption or change of state on a single element by an SEU will not change the state flow of a circuit or lead to impermissible state changes. In one embodiment, the invention is implemented in quasi-delay-insensitive (QDI) asynchronous circuits.