Integrated circuit and a method for measuring a quiescent current of a module

A method for evaluating a quiescent current, the method includes: measuring, when a module is at a first mode, a first voltage drop on a first resistor that is coupled between a supply pin of an integrated circuit that comprises the module and a first test pin of the integrated circuit; assessing, when the module is at a second mode, a second voltage drop on a second resistor that is coupled between the supply pin and a second test pin of the integrated circuit; and evaluating a quiescent current of the module in response to the first and second voltage drops; wherein expected values of quiescent current of the module differ from one mode to the other; and wherein a resistance of the first resistor differs from the resistance of the second resistor.