Reducing mission signal output delay in IC having mission and test modes

Reducing mission signal output delay in IC having mission and test modes

An integrated circuit apparatus includes a switching circuit that provides respective signal paths to permit a mission signal, a test signal, and a boundary scan test signal to share an output terminal. The signal path associated with the mission signal imposes a smaller switching delay than do the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Seibold, John Joseph
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Seibold, John Joseph
description An integrated circuit apparatus includes a switching circuit that provides respective signal paths to permit a mission signal, a test signal, and a boundary scan test signal to share an output terminal. The signal path associated with the mission signal imposes a smaller switching delay than do the signal paths associated with the test and boundary scan test signals.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07649379</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07649379</sourcerecordid><originalsourceid>FETCH-uspatents_grants_076493793</originalsourceid><addsrcrecordid>eNrjZPAISk0pTc7MS1fIzSwuzszPUyjOTM9LzFHILy0pKC1RSEnNSaxUyMxT8HRWyEgsQ1aYmJeiUJJaXKKQm5-SWszDwJqWmFOcyguluRkU3FxDnD10S4sLEktS80qK49OLEkGUgbmZiaWxuaUxEUoASS009Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Reducing mission signal output delay in IC having mission and test modes</title><source>USPTO Issued Patents</source><creator>Seibold, John Joseph</creator><creatorcontrib>Seibold, John Joseph ; Texas Instruments Incorporated</creatorcontrib><description>An integrated circuit apparatus includes a switching circuit that provides respective signal paths to permit a mission signal, a test signal, and a boundary scan test signal to share an output terminal. The signal path associated with the mission signal imposes a smaller switching delay than do the signal paths associated with the test and boundary scan test signals.</description><language>eng</language><creationdate>2010</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7649379$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,780,802,885,64039</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7649379$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Seibold, John Joseph</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><title>Reducing mission signal output delay in IC having mission and test modes</title><description>An integrated circuit apparatus includes a switching circuit that provides respective signal paths to permit a mission signal, a test signal, and a boundary scan test signal to share an output terminal. The signal path associated with the mission signal imposes a smaller switching delay than do the signal paths associated with the test and boundary scan test signals.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2010</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZPAISk0pTc7MS1fIzSwuzszPUyjOTM9LzFHILy0pKC1RSEnNSaxUyMxT8HRWyEgsQ1aYmJeiUJJaXKKQm5-SWszDwJqWmFOcyguluRkU3FxDnD10S4sLEktS80qK49OLEkGUgbmZiaWxuaUxEUoASS009Q</recordid><startdate>20100119</startdate><enddate>20100119</enddate><creator>Seibold, John Joseph</creator><scope>EFH</scope></search><sort><creationdate>20100119</creationdate><title>Reducing mission signal output delay in IC having mission and test modes</title><author>Seibold, John Joseph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_076493793</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2010</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Seibold, John Joseph</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Seibold, John Joseph</au><aucorp>Texas Instruments Incorporated</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Reducing mission signal output delay in IC having mission and test modes</title><date>2010-01-19</date><risdate>2010</risdate><abstract>An integrated circuit apparatus includes a switching circuit that provides respective signal paths to permit a mission signal, a test signal, and a boundary scan test signal to share an output terminal. The signal path associated with the mission signal imposes a smaller switching delay than do the signal paths associated with the test and boundary scan test signals.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_07649379
source USPTO Issued Patents
title Reducing mission signal output delay in IC having mission and test modes
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T06%3A42%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Seibold,%20John%20Joseph&rft.aucorp=Texas%20Instruments%20Incorporated&rft.date=2010-01-19&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07649379%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true