Reducing mission signal output delay in IC having mission and test modes
An integrated circuit apparatus includes a switching circuit that provides respective signal paths to permit a mission signal, a test signal, and a boundary scan test signal to share an output terminal. The signal path associated with the mission signal imposes a smaller switching delay than do the...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | An integrated circuit apparatus includes a switching circuit that provides respective signal paths to permit a mission signal, a test signal, and a boundary scan test signal to share an output terminal. The signal path associated with the mission signal imposes a smaller switching delay than do the signal paths associated with the test and boundary scan test signals. |
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