Through hole formation state detecting device and electronic timepiece using the detecting device

When a light emission element emits no light, a detected signal from a photodetection element is captured as an intensity of external light. Then, a threshold value is offset by the intensity of the external light. The offset threshold is then compared to a detected signal from the photodetection el...

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Bibliographische Detailangaben
Hauptverfasser: Ono, Haruo, Chubachi, Hiroyuki
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:When a light emission element emits no light, a detected signal from a photodetection element is captured as an intensity of external light. Then, a threshold value is offset by the intensity of the external light. The offset threshold is then compared to a detected signal from the photodetection element when the light emission element emits light, thereby determining the presence of a through hole between the light emission element and the photodetection element through which hole light passes without being influenced by external light.