In-circuit Vt distribution bit counter for non-volatile memory devices

Integrated testing components and testing algorithm on a non-volatile memory module provide faster Vt (threshold voltage) distributions during the module verification process. The memory module includes address and voltage scanning components and a bit counter for storing the number of 0's or 1's for a specified voltage. As the range of addresses are scanned across a range of voltages, the instances of the count value being counted is accumulated by the bit counter. Automated Tester Equipment (ATE) reads the accumulated count value for each tested voltage.