Method and apparatus for pipelined scan compression

A pipelined scan compression method and apparatus for reducing test data volume and test application time in a scan-based integrated circuit without reducing the speed of the scan chain operation in scan-test mode or self-test mode. The integrated circuit contains one or more scan chains, each scan...

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Hauptverfasser: Abdel-Hafez, Khader S, Wang, Laung-Terng (L.-T.), Sheu, Boryau (Jack), Wu, Shianling
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Sprache:eng
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creator Abdel-Hafez, Khader S
Wang, Laung-Terng (L.-T.)
Sheu, Boryau (Jack)
Wu, Shianling
description A pipelined scan compression method and apparatus for reducing test data volume and test application time in a scan-based integrated circuit without reducing the speed of the scan chain operation in scan-test mode or self-test mode. The integrated circuit contains one or more scan chains, each scan chain comprising one or more scan cells coupled in series. A decompressor is embedded between N scan chains and M scan chains, where N
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title Method and apparatus for pipelined scan compression
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