Method and apparatus for pipelined scan compression
A pipelined scan compression method and apparatus for reducing test data volume and test application time in a scan-based integrated circuit without reducing the speed of the scan chain operation in scan-test mode or self-test mode. The integrated circuit contains one or more scan chains, each scan...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A pipelined scan compression method and apparatus for reducing test data volume and test application time in a scan-based integrated circuit without reducing the speed of the scan chain operation in scan-test mode or self-test mode. The integrated circuit contains one or more scan chains, each scan chain comprising one or more scan cells coupled in series. A decompressor is embedded between N scan chains and M scan chains, where N |
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