Semiconductive device fabricated using a raised layer to silicide the gate
In one aspect, the invention provides a method of fabricating a semiconductive device that comprises forming a raised layer [] adjacent a gate [] and over a source/drain [], depositing a silicidation layer [] over the gate [] and the raised layer [], and moving at least a portion of the silicidation...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | In one aspect, the invention provides a method of fabricating a semiconductive device that comprises forming a raised layer [] adjacent a gate [] and over a source/drain [], depositing a silicidation layer [] over the gate [] and the raised layer [], and moving at least a portion of the silicidation layer [] into the source/drain [] through the raised layer [ |
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