System and method for producing color contour maps of surface defects of high pressure pipelines
A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes t...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Crouch, Alfred E Goyen, Todd Porter, Patrick C Laughlin, Shawn |
description | A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils in a paired arrangement. A receive circuit connected to the coils is tuned to a resonant frequency, and the transducer coils operate in a send/receive mode. In another feature of the invention, there are means for converting a change in measured resonance to a visual display of the depth and width of the surface defect. |
format | Patent |
fullrecord | <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07557570</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07557570</sourcerecordid><originalsourceid>FETCH-uspatents_grants_075575703</originalsourceid><addsrcrecordid>eNqNi00KgiEURZ00iGoPbwPBByEuIIpvXvMSff6A-sSng3afRQtodLj33LsVz9uLO2bQxULGHsiCowa1kR0mFg-G0syGSqfRIOvKQA54NKcNgkWHpn-rEH2YP-TpEGqsmGJB3ouN04nx8ONOwPVyP6_HwVV3LJ0fvukPFiWlkmo5_TF5A4nJPnU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>System and method for producing color contour maps of surface defects of high pressure pipelines</title><source>USPTO Issued Patents</source><creator>Crouch, Alfred E ; Goyen, Todd ; Porter, Patrick C ; Laughlin, Shawn</creator><creatorcontrib>Crouch, Alfred E ; Goyen, Todd ; Porter, Patrick C ; Laughlin, Shawn ; The Clock Spring Company L.P</creatorcontrib><description>A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils in a paired arrangement. A receive circuit connected to the coils is tuned to a resonant frequency, and the transducer coils operate in a send/receive mode. In another feature of the invention, there are means for converting a change in measured resonance to a visual display of the depth and width of the surface defect.</description><language>eng</language><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7557570$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7557570$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Crouch, Alfred E</creatorcontrib><creatorcontrib>Goyen, Todd</creatorcontrib><creatorcontrib>Porter, Patrick C</creatorcontrib><creatorcontrib>Laughlin, Shawn</creatorcontrib><creatorcontrib>The Clock Spring Company L.P</creatorcontrib><title>System and method for producing color contour maps of surface defects of high pressure pipelines</title><description>A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils in a paired arrangement. A receive circuit connected to the coils is tuned to a resonant frequency, and the transducer coils operate in a send/receive mode. In another feature of the invention, there are means for converting a change in measured resonance to a visual display of the depth and width of the surface defect.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNi00KgiEURZ00iGoPbwPBByEuIIpvXvMSff6A-sSng3afRQtodLj33LsVz9uLO2bQxULGHsiCowa1kR0mFg-G0syGSqfRIOvKQA54NKcNgkWHpn-rEH2YP-TpEGqsmGJB3ouN04nx8ONOwPVyP6_HwVV3LJ0fvukPFiWlkmo5_TF5A4nJPnU</recordid><startdate>20090707</startdate><enddate>20090707</enddate><creator>Crouch, Alfred E</creator><creator>Goyen, Todd</creator><creator>Porter, Patrick C</creator><creator>Laughlin, Shawn</creator><scope>EFH</scope></search><sort><creationdate>20090707</creationdate><title>System and method for producing color contour maps of surface defects of high pressure pipelines</title><author>Crouch, Alfred E ; Goyen, Todd ; Porter, Patrick C ; Laughlin, Shawn</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_075575703</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Crouch, Alfred E</creatorcontrib><creatorcontrib>Goyen, Todd</creatorcontrib><creatorcontrib>Porter, Patrick C</creatorcontrib><creatorcontrib>Laughlin, Shawn</creatorcontrib><creatorcontrib>The Clock Spring Company L.P</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Crouch, Alfred E</au><au>Goyen, Todd</au><au>Porter, Patrick C</au><au>Laughlin, Shawn</au><aucorp>The Clock Spring Company L.P</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and method for producing color contour maps of surface defects of high pressure pipelines</title><date>2009-07-07</date><risdate>2009</risdate><abstract>A system for mapping a surface defect in an electrically-conducting material by measuring a change in the resonance of the material includes a flexible printed circuit board and a two dimensional array of transducers printed on the flexible circuit board, wherein each element of the array includes two transducer coils in a paired arrangement. A receive circuit connected to the coils is tuned to a resonant frequency, and the transducer coils operate in a send/receive mode. In another feature of the invention, there are means for converting a change in measured resonance to a visual display of the depth and width of the surface defect.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_uspatents_grants_07557570 |
source | USPTO Issued Patents |
title | System and method for producing color contour maps of surface defects of high pressure pipelines |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T17%3A12%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Crouch,%20Alfred%20E&rft.aucorp=The%20Clock%20Spring%20Company%20L.P&rft.date=2009-07-07&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07557570%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |