Substrate and a method for polishing a substrate

A substrate having flatness of less than 230 nmPV and surface roughness at RMS of less than 0.20 nm. is obtained by a method comprising: a process of polishing an object to be polished with a polishing pad comprising at least one layer having compressibility of 5% or below in a base layer of the pol...

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Bibliographische Detailangaben
Hauptverfasser: Nakamura, Kazuyoshi, Nakajima, Toshihide, Nakajima, Kousuke, Oonami, Takahisa
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A substrate having flatness of less than 230 nmPV and surface roughness at RMS of less than 0.20 nm. is obtained by a method comprising: a process of polishing an object to be polished with a polishing pad comprising at least one layer having compressibility of 5% or below in a base layer of the polishing pad.