Diffuser, wavefront source, wavefront sensor and projection exposure apparatus

ababaA wavefront source having a wavefront formation structure and a diffuser with a scattering structure in the beam path in front of or at the level of the wavefront formation structure; also a diffuser configured to be used therefor, and a wavefront sensor equipped therewith, as well as a corresp...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Schriever, Martin, Haidner, Helmut
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:ababaA wavefront source having a wavefront formation structure and a diffuser with a scattering structure in the beam path in front of or at the level of the wavefront formation structure; also a diffuser configured to be used therefor, and a wavefront sensor equipped therewith, as well as a corresponding projection exposure apparatus. The diffuser has a diffractive computer-generated hologram (CGH) scattering structure with a predetermined angular scattering profile. The wavefront source includes such a diffuser and/or a focusing element with a reflecting diffractive focusing structure in the beam path at the level of the scattering structure or between the scattering structure and the wavefront formation structure. The disclosed structures are used, e.g., in the wavefront measurement of projection objectives in microlithography projection exposure apparatuses in the EUV wavelength range.