Method for using internal semiconductor junctions to aid in non-contact testing
Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT.
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | Capacitive leadframe testing techniques are improved through knowledge of characteristics of semiconductor junctions specific to nodes of device under test (DUT) that are connected to nodes under test of the DUT. |
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