System and method for automatic extraction of testing information from a functional specification
A system and method for testing a development device includes extracting multiple parameters of the development device from a product specification for the development device. The parameters being arranged in a predetermined first order. The parameters are stored in a testing data file. The testing...
Gespeichert in:
| Hauptverfasser: | , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | A system and method for testing a development device includes extracting multiple parameters of the development device from a product specification for the development device. The parameters being arranged in a predetermined first order. The parameters are stored in a testing data file. The testing data file can be input into a test bench system being coupled to the development device. The test bench system can test the development device. |
|---|