Method for detecting lateral surface charge migration through double exposure averaging

Method for detecting lateral surface charge migration through double exposure averaging

The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, th...

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Bibliographische Detailangaben
Hauptverfasser: Silvestri, Markus Rudolf, Jeyadev, Surendar, Mishra, Satchidanand, Hinckel, M. John, Domm, Edward, Markovics, James M
Format: Patent
Sprache:eng
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Zusammenfassung:The amount of lateral charge migration (LCM) on a photoreceptor is quantified by measuring the average potential of a latent image formed on the photoreceptor surface. The surface is first uniformly charged, then exposed a first time to an image. After a waiting period during which LCM may occur, the surface is exposed a second time to the image. After another waiting period, the average potential is measured. The amount of LCM may be quantified by varying the waiting periods.