Measurement of phase nonlinearity of non-linear devices

A method for determining the phase characteristics of a nonlinear analog device includes application of a test signal, which may be linear-FM, to the nonlinear device. The converted signal is digitized and mathematically converted to baseband in ideal fashion. A digitized version of the original tes...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Delos, Peter L, Zaff, David B, Smith, Matthew W
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method for determining the phase characteristics of a nonlinear analog device includes application of a test signal, which may be linear-FM, to the nonlinear device. The converted signal is digitized and mathematically converted to baseband in ideal fashion. A digitized version of the original test signal and the downconverted signal are phase compared to determine the phase error.