Integrated test-on-chip system and method and apparatus for manufacturing and operating same

A microchip system comprises a self check subsystem operable to perform a self test of at least one subsystem of the microchip system, and/or on the interoperability of subsystems. An antenna and a communications subsystem wirelessly transmit self check information from the microchip system. The communications subsystem may also receive information, data or instructions from an off-chip system or device. Self check tests may occur during manufacture of the microchip system and/or during operation. The microchip system may comprise a passive power subsystem coupled to an antenna to receive power in the form of an electromagnetic field, and which provides electrical power derived therefrom to at least one other subsystem of the microchip system.