Arrangements having IC voltage and thermal resistance designated on a per IC basis

Arrangements having IC voltage and thermal resistance designated on a per IC basis

Systems for testing a plurality of integrated circuits at a plurality of frequencies and voltages is disclosed. In one embodiment, a plurality of integrated circuits is tested at least once within a predetermined set of combinations of frequencies and voltages. If the integrated circuit fails testin...

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Bibliographische Detailangaben
Hauptverfasser: Arabi, Tawfik, Ma, Hung-Piao, Iovino, Gregory M, Rotem, Shai, Kornfeld, Avner, Taylor, Gregory F
Format: Patent
Sprache:eng
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Zusammenfassung:Systems for testing a plurality of integrated circuits at a plurality of frequencies and voltages is disclosed. In one embodiment, a plurality of integrated circuits is tested at least once within a predetermined set of combinations of frequencies and voltages. If the integrated circuit fails testing within any combination of a frequency and voltage within the predetermined set, the integrated circuit is retested at a different predetermined set of combinations of frequencies and voltages. If the integrated circuit fails testing within any combination of a frequency and voltage within the different predetermined set, the integrated circuit is discarded.