Test for weak SRAM cells

A method and apparatus for testing a static random access memory (SRAM) array for the presence of weak defects. A 0/1 ratio is first written to the memory array (step ), following which the bit lines BL and BLB are pre-charged and equalized to a threshold detection voltage (step ). The threshold det...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Pineda De Gyvez, Jose De Jesus, Sachdev, Manoj, Pavlov, Andrei
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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