Cost-independent criticality-based move selection for simulated annealing

A method of physical design for a programmable logic device (PLD) can include associating movable objects of the PLD with a criticality measure that is dependent upon timing information for a configuration of the PLD. The method further can include calculating the criticality measure for each movable object and calculating a probability for each movable object. The probability can depend upon the criticality measure for the movable object. The method also can include selecting one or more of the movable objects for controlled move generation within a simulated annealing process. Movable objects are selected for controlled move generation according to the probabilities assigned to the movable objects.