Titanium underlayer for lines in semiconductor devices

A thin Titanium underlayer is included beneath a Titanium rich Titanium Nitride layer in a metal line on a silicon substrate to reduce stress voiding.

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Hauptverfasser: Ng, Khim Hong, Ng, Yeow Keong, Koh, Kar Hwee
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Sprache:eng
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creator Ng, Khim Hong
Ng, Yeow Keong
Koh, Kar Hwee
description A thin Titanium underlayer is included beneath a Titanium rich Titanium Nitride layer in a metal line on a silicon substrate to reduce stress voiding.
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fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07179743</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07179743</sourcerecordid><originalsourceid>FETCH-uspatents_grants_071797433</originalsourceid><addsrcrecordid>eNrjZDALySxJzMsszVUozUtJLcpJrEwtUkjLL1LIycxLLVbIzFMoTs3NTM7PSylNLgEKp6SWZSanFvMwsKYl5hSn8kJpbgYFN9cQZw_d0uKCxJLUvJLi-PSiRBBlYG5obmluYmxMhBIApJAu-A</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Titanium underlayer for lines in semiconductor devices</title><source>USPTO Issued Patents</source><creator>Ng, Khim Hong ; Ng, Yeow Keong ; Koh, Kar Hwee</creator><creatorcontrib>Ng, Khim Hong ; Ng, Yeow Keong ; Koh, Kar Hwee ; Systems on Silicon Manufacturing Company Pte. Ltd</creatorcontrib><description>A thin Titanium underlayer is included beneath a Titanium rich Titanium Nitride layer in a metal line on a silicon substrate to reduce stress voiding.</description><language>eng</language><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7179743$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7179743$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Ng, Khim Hong</creatorcontrib><creatorcontrib>Ng, Yeow Keong</creatorcontrib><creatorcontrib>Koh, Kar Hwee</creatorcontrib><creatorcontrib>Systems on Silicon Manufacturing Company Pte. Ltd</creatorcontrib><title>Titanium underlayer for lines in semiconductor devices</title><description>A thin Titanium underlayer is included beneath a Titanium rich Titanium Nitride layer in a metal line on a silicon substrate to reduce stress voiding.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZDALySxJzMsszVUozUtJLcpJrEwtUkjLL1LIycxLLVbIzFMoTs3NTM7PSylNLgEKp6SWZSanFvMwsKYl5hSn8kJpbgYFN9cQZw_d0uKCxJLUvJLi-PSiRBBlYG5obmluYmxMhBIApJAu-A</recordid><startdate>20070220</startdate><enddate>20070220</enddate><creator>Ng, Khim Hong</creator><creator>Ng, Yeow Keong</creator><creator>Koh, Kar Hwee</creator><scope>EFH</scope></search><sort><creationdate>20070220</creationdate><title>Titanium underlayer for lines in semiconductor devices</title><author>Ng, Khim Hong ; Ng, Yeow Keong ; Koh, Kar Hwee</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_071797433</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2007</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Ng, Khim Hong</creatorcontrib><creatorcontrib>Ng, Yeow Keong</creatorcontrib><creatorcontrib>Koh, Kar Hwee</creatorcontrib><creatorcontrib>Systems on Silicon Manufacturing Company Pte. Ltd</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ng, Khim Hong</au><au>Ng, Yeow Keong</au><au>Koh, Kar Hwee</au><aucorp>Systems on Silicon Manufacturing Company Pte. Ltd</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Titanium underlayer for lines in semiconductor devices</title><date>2007-02-20</date><risdate>2007</risdate><abstract>A thin Titanium underlayer is included beneath a Titanium rich Titanium Nitride layer in a metal line on a silicon substrate to reduce stress voiding.</abstract><oa>free_for_read</oa></addata></record>
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title Titanium underlayer for lines in semiconductor devices
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T20%3A59%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Ng,%20Khim%20Hong&rft.aucorp=Systems%20on%20Silicon%20Manufacturing%20Company%20Pte.%20Ltd&rft.date=2007-02-20&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07179743%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true