Etching method

2 2 An etching method comprises a step of forming a via hole structure based on a photoresist film layer for forming a wiring pattern, a silicon oxide film layer which is a hard mask layer formed under the photoresist film, and an organic Low-k film layer formed under the hard mask layer, wherein in...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Harada, Akitoshi, Inazawa, Koichiro
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:2 2 An etching method comprises a step of forming a via hole structure based on a photoresist film layer for forming a wiring pattern, a silicon oxide film layer which is a hard mask layer formed under the photoresist film, and an organic Low-k film layer formed under the hard mask layer, wherein in the step, the organic film layer and the organic Low-k film layer are etched by using a mixture gas of Ngas, Hgas, and a CF gas.