X-ray diffractometer for high flux grazing incidence diffraction

An X-ray diffractometer comprising an X-ray source emitting a line focus X-ray beam wherein the larger extension of the beam cross section defines a line direction of the X-ray beam, further comprising a sample, and an X-ray detector rotatable in a scattering plane around an axis ω intersecting the position of the sample is characterized in that the X-ray source is mounted to a switching device, which allows to move the X-ray source into one of two fixed positions with respect to the scattering plane, wherein in the first position the line direction of the X-ray beam is parallel to the scattering plane and in the second position the line direction of the X-ray beam is perpendicular to the scattering plane, and wherein the path of the X-ray beam in the two fixed positions of the X-ray source is the same. This X-ray diffractometer has a simple mechanical setup and allows in plane grazing incidence diffraction as well as regular XRD measurements with good resolution.