Semiconductor device tester with slanted contact ends
A semiconductor tester device includes at least a probe having a plunger making contact with a semiconductor device at one end and being slanted at the other end, and an elastic member able to shrink when pressed with the plunger; and a print substrate with wiring formed to test the semiconductor de...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A semiconductor tester device includes at least a probe having a plunger making contact with a semiconductor device at one end and being slanted at the other end, and an elastic member able to shrink when pressed with the plunger; and a print substrate with wiring formed to test the semiconductor device; wherein the print substrate has at least a hole to put the probe in, and the hole has an electrically conductive wall to make contact with a side end of the plunger when the elastic member is pressed at the slanted end of the plunger. |
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