Broadside compare with retest on fail

Broadside compare with retest on fail

A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Williams, Randy L, Fitzgerald, Glenn R, Henson, Michael, Gloria, Julian I, Bishop, Bruce D
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Williams, Randy L
Fitzgerald, Glenn R
Henson, Michael
Gloria, Julian I
Bishop, Bruce D
description A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed after a specified time the device is considered a fail.
format Patent
fullrecord <record><control><sourceid>uspatents_EFH</sourceid><recordid>TN_cdi_uspatents_grants_07027946</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>07027946</sourcerecordid><originalsourceid>FETCH-uspatents_grants_070279463</originalsourceid><addsrcrecordid>eNrjZFB1KspPTCnOTElVSM7PLUgsSlUozyzJUChKLUktLlHIz1NIS8zM4WFgTUvMKU7lhdLcDApuriHOHrqlxQWJJal5JcXx6UWJIMrA3MDI3NLEzJgIJQAKICfg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Broadside compare with retest on fail</title><source>USPTO Issued Patents</source><creator>Williams, Randy L ; Fitzgerald, Glenn R ; Henson, Michael ; Gloria, Julian I ; Bishop, Bruce D</creator><creatorcontrib>Williams, Randy L ; Fitzgerald, Glenn R ; Henson, Michael ; Gloria, Julian I ; Bishop, Bruce D ; Texas Instruments Incorporated</creatorcontrib><description>A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed after a specified time the device is considered a fail.</description><language>eng</language><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7027946$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64015</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7027946$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Williams, Randy L</creatorcontrib><creatorcontrib>Fitzgerald, Glenn R</creatorcontrib><creatorcontrib>Henson, Michael</creatorcontrib><creatorcontrib>Gloria, Julian I</creatorcontrib><creatorcontrib>Bishop, Bruce D</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><title>Broadside compare with retest on fail</title><description>A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed after a specified time the device is considered a fail.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNrjZFB1KspPTCnOTElVSM7PLUgsSlUozyzJUChKLUktLlHIz1NIS8zM4WFgTUvMKU7lhdLcDApuriHOHrqlxQWJJal5JcXx6UWJIMrA3MDI3NLEzJgIJQAKICfg</recordid><startdate>20060411</startdate><enddate>20060411</enddate><creator>Williams, Randy L</creator><creator>Fitzgerald, Glenn R</creator><creator>Henson, Michael</creator><creator>Gloria, Julian I</creator><creator>Bishop, Bruce D</creator><scope>EFH</scope></search><sort><creationdate>20060411</creationdate><title>Broadside compare with retest on fail</title><author>Williams, Randy L ; Fitzgerald, Glenn R ; Henson, Michael ; Gloria, Julian I ; Bishop, Bruce D</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_070279463</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Williams, Randy L</creatorcontrib><creatorcontrib>Fitzgerald, Glenn R</creatorcontrib><creatorcontrib>Henson, Michael</creatorcontrib><creatorcontrib>Gloria, Julian I</creatorcontrib><creatorcontrib>Bishop, Bruce D</creatorcontrib><creatorcontrib>Texas Instruments Incorporated</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Williams, Randy L</au><au>Fitzgerald, Glenn R</au><au>Henson, Michael</au><au>Gloria, Julian I</au><au>Bishop, Bruce D</au><aucorp>Texas Instruments Incorporated</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Broadside compare with retest on fail</title><date>2006-04-11</date><risdate>2006</risdate><abstract>A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed after a specified time the device is considered a fail.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_uspatents_grants_07027946
source USPTO Issued Patents
title Broadside compare with retest on fail
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T07%3A57%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-uspatents_EFH&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Williams,%20Randy%20L&rft.aucorp=Texas%20Instruments%20Incorporated&rft.date=2006-04-11&rft_id=info:doi/&rft_dat=%3Cuspatents_EFH%3E07027946%3C/uspatents_EFH%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true