Broadside compare with retest on fail
A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed a...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A tester routine is provided that evaluates multiple test pins, on multiple devices under test, at the same time and only if a fail occurs does any evaluation have to be made. In the case of a failing pin on any device only that device with the falling pin is retested until passed or if not passed after a specified time the device is considered a fail. |
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