Test system for identification and sorting of integrated circuit devices

A system for identifying and sorting integrated circuit devices based on an encrypted Fuse ID information such as manufacturing and test information stored in the integrated circuit device, includes a test fixture for receiving an integrated circuit device to be identified and sorted. The system further includes a portable, user friendly processor communicatively coupled to the test fixture to read the stored encrypted device identification data from the integrated circuit device and decrypt the read encrypted Fuse ID information, and to compare the decrypted device identification data to a previously entered sort criteria and to identify and sort the integrated circuit device based on the outcome of the comparison.