Feature extraction apparatus and method and pattern recognition apparatus and method
A feature extraction and pattern recognition system in which an observation vector forming input data, which represents a certain point in the observation vector space, is mapped to a distribution having a spread in the feature vector space, and a feature distribution parameter representing the dist...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | A feature extraction and pattern recognition system in which an observation vector forming input data, which represents a certain point in the observation vector space, is mapped to a distribution having a spread in the feature vector space, and a feature distribution parameter representing the distribution is determined. Pattern recognition of the input data is performed based on the feature distribution parameter. |
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