Copper-containing C4 ball-limiting metallurgy stack for enhanced reliability of packaged structures and method of making same

The invention relates to a ball-limiting metallurgy stack for an electrical device that contains at least one copper layer disposed upon a Ti adhesion metal layer. The ball-limiting metallurgy stack resists Sn migration toward the upper metallization of the device.

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Bibliographische Detailangaben
Hauptverfasser: Datta, Madhav, Emory, Dave, Joshi, Subhash M, Menezes, Susanne, Suh, Doowon
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
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