Method for forming a passivation layer for air gap formation

a, bab ab ab abDummy features are formed within an interlevel dielectric layer. Passivation layers (and ) are formed by electroless deposition to protect the underlying conductive regions (and ) from being penetrated from the air gaps. In addition, the passivation layers (and ) overhang the underlyi...

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Bibliographische Detailangaben
Hauptverfasser: Goldberg, Cindy K, Filipiak, Stanley Michael, Flake, John C, Lii, Yeong-Jyh T, Smith, Bradley P, Solomentsev, Yuri E, Sparks, Terry G, Strozewski, Kirk J, Yu, Kathleen C
Format: Patent
Sprache:eng
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Zusammenfassung:a, bab ab ab abDummy features are formed within an interlevel dielectric layer. Passivation layers (and ) are formed by electroless deposition to protect the underlying conductive regions (and ) from being penetrated from the air gaps. In addition, the passivation layers (and ) overhang the underlying conductive regions (and ), thereby defining dummy features (and ) adjacent the conductive regions (and ). The passivation layers (and ) can be formed without additional patterning steps and help minimize misaligned vias from puncturing air gaps.