Substrate selector

The present invention relates to substrate-selecting equipment for a photomask used for the production of a semiconductor integrated circuit and in particular to substrate-selecting equipment for selecting a substrate used for an objective product from among a group of substrates with photosensitive material layer used for the production of photomasks. Substrate-selecting equipment selects substrates used for objective products from among a group of substrates with photosensitive material layers used for the production of photomask. The substrate-selecting equipment comprises one or more of the defect-registering part(s) for registering the results of the inspection of defects of substrates with photosensitive material layers in database, the photosensitive material layer lot check result-registering part for registering the results of check of lots of photosensitive material layers in database and the substrate-selecting part for selecting substrates used for the production of objective products from among a group of substrates with photosensitive material layers, on the basis of the results of inspection of defects and the results of check of lots of photosensitive materials registered in database.