Measuring system including positioning and data transfer

The invention relates to a system for measuring thickness of material, and more specifically it relates primarily to a method and a sensor for measuring thickness distribution in a material by half-wave resonance in the material that is subjected to measurement. Furthermore, the invention relates to an automatic positioning system suitable for positioning one or more sensors in a system for measuring distribution of thickness in material in an object that is to be measured. The invention provides a system for measuring, characterizing, verifying and position-determining material properties of a selected object to be measured, in particular thickness distribution. A mobile measuring unit which is manouvered and operated manually or with the aid of a remote-control transport device senses half-wave resonance in objects to be measured and computes the thickness distribution. A new, accurate, partly acoustic positioning system determines the position of the measured area.