Using transition time checks to determine noise problems on signal lines of an integrated circuit

The present invention is generally related to integrated circuits (ICs) and, more particularly, to using transition times on signal lines in an IC to determine whether the signal lines have potential noise problems associated with them. For drivers of different sizes driving signal lines of different lengths, maximum transition time constraints are compared to signal transition times to determine whether a potential noise problem exists with respect to the signal lines. Each driver size has a maximum line length and a maximum transition time associated with it. These maximum transition time constraints are used to determine whether the signal lines connected to respective drivers in the IC will have potential noise problems associated with them. For each signal line in the IC design, the signal transition time is determined and compared to the maximum transition time constraint. If the signal transition time exceeds the maximum transition time constraint, a potential noise problem exists with respect to the signal line.