Test system and methodology

This invention relates to test equipment and test techniques, especially equipment and techniques for testing electronic devices such as integrated circuits. A test system for testing an electronic device is deployable in two basic configurations. In one of the configurations, a load board () that receives a unit () of the device is directly attached to a test head (). In the other configuration, the same load board or one having largely the same pattern of test-head signal transmission positions is coupled through an interface apparatus () to a test head. A probe system () contacts that load board or/and the interface apparatus. The interface apparatus is normally configured to largely prevent test-head vibrations from being transferred to the probe system. Additionally or alternatively, the load board is vacuum attached to the interface apparatus.