Determination of a process flow based upon fault detection analysis

1. Field of the Invention A method and an apparatus for the determination of a process flow based upon fault detection. A process step upon a workpiece is performed. Fault detection analysis based upon the process step performed upon the workpiece is performed. A workpiece routing process is perform...

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Hauptverfasser: Adams, III, Ernest D, Purdy, Matthew A, Cherry, Gregory A, Green, Eric O, Coss, Jr., Elfido, Cusson, Brian K, Jenkins, Naomi M, Cowan, Patrick M
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:1. Field of the Invention A method and an apparatus for the determination of a process flow based upon fault detection. A process step upon a workpiece is performed. Fault detection analysis based upon the process step performed upon the workpiece is performed. A workpiece routing process is performed based upon the fault detection analysis. The wafer routing process includes using a controller to perform one or a rework process routing, a non-standard process routing, a fault verification process routing, a normal process routing, or a termination process routing, based upon the fault detection analysis.