Method for generating transfer functions

The invention relates to a method for generating semi-empirical transfer functions. An existing design process known as the design for six sigma (DFSS) process focuses on meeting critical to quality (CTQ) parameters by controlling one or more key control parameters (KCP's) and/or key noise para...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Wakeman, Thomas George
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The invention relates to a method for generating semi-empirical transfer functions. An existing design process known as the design for six sigma (DFSS) process focuses on meeting critical to quality (CTQ) parameters by controlling one or more key control parameters (KCP's) and/or key noise parameters (KNP's). In the DFSS process, the transfer functions can be represented as An exemplary embodiment of the invention is directed to a method for determining a transfer function relating a critical to quality parameter to key parameters in a design for six sigma process. The method includes determining a dimensionless group containing a plurality of key parameters. The key parameters may include key control parameters or key noise parameters that have an affect on the critical to quality parameter. A transfer function relating the dimensionless group to the critical to quality parameter is then generated.