Discharge source with gas curtain for protecting optics from particles
This invention relates generally to the production of extreme ultraviolet and soft x-rays for projection lithography. A gas curtain device is employed to deflect debris that is generated by an extreme ultraviolet and soft x-ray radiation discharge source such as an electric discharge plasma source....
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creator | Fornaciari, Neal R Kanouff, Michael P |
description | This invention relates generally to the production of extreme ultraviolet and soft x-rays for projection lithography.
A gas curtain device is employed to deflect debris that is generated by an extreme ultraviolet and soft x-ray radiation discharge source such as an electric discharge plasma source. The gas curtain device projects a stream of gas over the path of the radiation to deflect debris particles into a direction that is different from that of the path of the radiation. The gas curtain can be employed to prevent debris accumulation on the optics used in photolithography. |
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A gas curtain device is employed to deflect debris that is generated by an extreme ultraviolet and soft x-ray radiation discharge source such as an electric discharge plasma source. The gas curtain device projects a stream of gas over the path of the radiation to deflect debris particles into a direction that is different from that of the path of the radiation. The gas curtain can be employed to prevent debris accumulation on the optics used in photolithography.</description><language>eng</language><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6714624$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64012</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6714624$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Fornaciari, Neal R</creatorcontrib><creatorcontrib>Kanouff, Michael P</creatorcontrib><creatorcontrib>EUV LLC</creatorcontrib><title>Discharge source with gas curtain for protecting optics from particles</title><description>This invention relates generally to the production of extreme ultraviolet and soft x-rays for projection lithography.
A gas curtain device is employed to deflect debris that is generated by an extreme ultraviolet and soft x-ray radiation discharge source such as an electric discharge plasma source. The gas curtain device projects a stream of gas over the path of the radiation to deflect debris particles into a direction that is different from that of the path of the radiation. The gas curtain can be employed to prevent debris accumulation on the optics used in photolithography.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNykEKAjEMQNFuXIh6h1xAGHUYD6AOHsC9hJB2CmNTkpS5vgoewNXjw1-H8ZqNJtTEYNKUGJbsEyQ0oKaOuUAUhariTJ5LAqmeySCqvKCifmJm24ZVxNl493MTYLw9Lvd9s4rOxe2ZFL90w_nQD8f-9MfyBhfFNNI</recordid><startdate>20040330</startdate><enddate>20040330</enddate><creator>Fornaciari, Neal R</creator><creator>Kanouff, Michael P</creator><scope>EFH</scope></search><sort><creationdate>20040330</creationdate><title>Discharge source with gas curtain for protecting optics from particles</title><author>Fornaciari, Neal R ; Kanouff, Michael P</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_067146243</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2004</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Fornaciari, Neal R</creatorcontrib><creatorcontrib>Kanouff, Michael P</creatorcontrib><creatorcontrib>EUV LLC</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Fornaciari, Neal R</au><au>Kanouff, Michael P</au><aucorp>EUV LLC</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Discharge source with gas curtain for protecting optics from particles</title><date>2004-03-30</date><risdate>2004</risdate><abstract>This invention relates generally to the production of extreme ultraviolet and soft x-rays for projection lithography.
A gas curtain device is employed to deflect debris that is generated by an extreme ultraviolet and soft x-ray radiation discharge source such as an electric discharge plasma source. The gas curtain device projects a stream of gas over the path of the radiation to deflect debris particles into a direction that is different from that of the path of the radiation. The gas curtain can be employed to prevent debris accumulation on the optics used in photolithography.</abstract><oa>free_for_read</oa></addata></record> |
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title | Discharge source with gas curtain for protecting optics from particles |
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