Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices

The present invention relates generally to integrated circuits. In particular, the present invention relates to a method for testing memory devices such as Double Data Rate (DDR) memory devices. A method for testing the data strobe window (DQS) and data valid window (tDV) of a memory device (e.g., a...

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Bibliographische Detailangaben

Hauptverfasser:	Corbin, Jr., William E, Monty, David P, Nelson, Erik A, Norris, Alan D, Tomashot, Steven W, Chapman, David E, Fiscus, Timothy E
Format:	Patent
Sprache:	eng
Online-Zugang:	Volltext bestellen
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