Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices

Method for guaranteeing a minimum data strobe valid window and a minimum data valid window for DDR memory devices

The present invention relates generally to integrated circuits. In particular, the present invention relates to a method for testing memory devices such as Double Data Rate (DDR) memory devices. A method for testing the data strobe window (DQS) and data valid window (tDV) of a memory device (e.g., a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Corbin, Jr., William E, Monty, David P, Nelson, Erik A, Norris, Alan D, Tomashot, Steven W, Chapman, David E, Fiscus, Timothy E
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present invention relates generally to integrated circuits. In particular, the present invention relates to a method for testing memory devices such as Double Data Rate (DDR) memory devices. A method for testing the data strobe window (DQS) and data valid window (tDV) of a memory device (e.g., a DDR-type memory device) using the window strobe of a testing system.