Method and apparatus for testing transducer heads in magnetic storage systems
The present invention relates generally to magnetic storage systems, more particularly, the present invention relates to testing transducer heads used in magnetic storage systems. An apparatus and associated testing method for identifying void heads in magnetic storage systems in which a first bit e...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| Zusammenfassung: | The present invention relates generally to magnetic storage systems, more particularly, the present invention relates to testing transducer heads used in magnetic storage systems.
An apparatus and associated testing method for identifying void heads in magnetic storage systems in which a first bit error rate is determined using data written at a first overshoot amount. A second bit error rate is determined using data written at a second rate current in a second overshoot amount. A physically damaged transducer head is identified based upon a comparison of the first bit error rate to the second bit error rate. |
|---|