Programmable non-volatile data storage circuit and a method for programming a non-volatile data storage circuit

The present invention relates to a programmable non-volatile data storage circuit, and in particular, though not limited to an on-chip storage circuit for storing a calibration code for an integrated circuit on the chip. The invention also relates to a method for programming a non-volatile data storage circuit and additionally the invention relates to an integrated circuit comprising a primary circuit and a programmable non-volatile data storage circuit comprising a calibration code for the primary circuit of the Integrated circuit. A programmable non-volatile data storage calibration circuit stores a calibration code for a temperature sensor circuit of an IC, comprising a programmable array of addressable bi-state, bi-stable first circuit elements each comprising a fusible resistor. A power supply controlled by a data input signal addresses the first circuit elements to be switched from a first to a second state in the fusible resistor state, the supply, and a clock signal applied to an I/O terminal clocks the data input signal to the interpreter circuit. The interpreter circuit sequentially selects and addresses the first circuit elements and enables switching of the first circuit elements when the supply voltage is at its maximum, blowing a selected fusible resistor. A second, similar circuit element is switched to its second state after programming the calibration circuit to prevent its further programming.