Globally distributed scan blocks

The present invention relates in general to integrated circuit (IC) testing and in particular to testing ICs having scan chains using Level Sensitive Scan Design (LSSD). A method and system for testing an integrated circuit (IC) comprising a plurality of logic units and a plurality of level sensitive scan design latches (LSSD) chains (scan chains) where the partitioning of the scan chains is different than the partitioning of the logic units. Scan blocks, each scan block comprising multiplexers, a pseudo random pattern generator (PRPG), a partitioned multiple input shift register (MISR), functional logic and control function logic are distributively placed around and close to scan inputs and scan outputs of the IC in otherwise unused area too small for larger functional logic blocks. The MISR, which contains many loaded latches and other logic, would normally be the largest element of the scan block has been partitioned into a sub-set of a full MISR to minimize the size of an individual scan block. The scan block has the functionality to enable LSSD testing, system testing and logic built in self test (LBIST) by the way the individual scan blocks are wired to the scan inputs and scan outputs of the logic units within the IC. Two or more scan blocks are needed to make a complete MISR depending on the sub-set partitioning of the MISR in each scan block. Scan block may have particular IC scan inputs and scan outputs wired into many different multiplexer inputs maintaining a known testability so wiring at the local level may be optimized. Since most of the wiring to the logic unit scan chains, wiring to the central scan switch is minimized reducing wiring complexity and cost. By partitioning the MISR, the size of the standardized Scan blocks is minimized allowing the most effective placement around logic units.