Method and apparatus for determining the location of a short in an electrical wire network

1. Technical Field A method and apparatus for locating a short between two nets in an electrical wire network of a microelectronic structure (e.g., chip, chip carrier, circuit card, etc.). A first net and a second net of the electrical wire are electrically shorted at an unknown point Pon the first...

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Bibliographische Detailangaben
Hauptverfasser: Lin, How T, Majka, Christopher J, Seward, Matthew Francis
Format: Patent
Sprache:eng
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Zusammenfassung:1. Technical Field A method and apparatus for locating a short between two nets in an electrical wire network of a microelectronic structure (e.g., chip, chip carrier, circuit card, etc.). A first net and a second net of the electrical wire are electrically shorted at an unknown point Pon the first net. Points Pand Pon the first net such are selected such that Pis located on a path between Pand Palong the first net. A constant current pulse source is electrically connected between Pand Pand is activated. Voltage drops V(from Pto P) and V(from Pto a point Pon the second net) are measured. A length Lof the path from Pto Pis calculated as a function of V/V. Computer graphics may be used to graphically display the location of the short within the microelectronic structure.