Apparatus for removing contaminants from a workpiece using a chemically reactive additive
1. Technical Field An apparatus for drying one or more workpieces. The apparatus includes the use of a chemically reactive additive to remove contaminants from the wafer surface during processing. In particular, during processing, a wafer is rinsed in a liquid bath and subsequently exposed to a chem...
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creator | Gaylord, III, Richard Hilliard Kern, Jr., Frederick William Martin, Donald Joseph Okorn-Schmidt, Harald Franz Snyder, John Joseph Syverson, William Alfred |
description | 1. Technical Field
An apparatus for drying one or more workpieces. The apparatus includes the use of a chemically reactive additive to remove contaminants from the wafer surface during processing. In particular, during processing, a wafer is rinsed in a liquid bath and subsequently exposed to a chemically reactive additive. The chemically reactive additive creates a surface tension gradient that physically and chemically alters the properties of the film of the rinse liquid so that the liquid and any contaminants contained therein are removed from the water surface. |
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An apparatus for drying one or more workpieces. The apparatus includes the use of a chemically reactive additive to remove contaminants from the wafer surface during processing. In particular, during processing, a wafer is rinsed in a liquid bath and subsequently exposed to a chemically reactive additive. The chemically reactive additive creates a surface tension gradient that physically and chemically alters the properties of the film of the rinse liquid so that the liquid and any contaminants contained therein are removed from the water surface.</description><language>eng</language><creationdate>2003</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6634371$$EPDF$$P50$$Guspatents$$Hfree_for_read</linktopdf><link.rule.ids>230,308,776,798,881,64016</link.rule.ids><linktorsrc>$$Uhttps://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6634371$$EView_record_in_USPTO$$FView_record_in_$$GUSPTO$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Gaylord, III, Richard Hilliard</creatorcontrib><creatorcontrib>Kern, Jr., Frederick William</creatorcontrib><creatorcontrib>Martin, Donald Joseph</creatorcontrib><creatorcontrib>Okorn-Schmidt, Harald Franz</creatorcontrib><creatorcontrib>Snyder, John Joseph</creatorcontrib><creatorcontrib>Syverson, William Alfred</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><title>Apparatus for removing contaminants from a workpiece using a chemically reactive additive</title><description>1. Technical Field
An apparatus for drying one or more workpieces. The apparatus includes the use of a chemically reactive additive to remove contaminants from the wafer surface during processing. In particular, during processing, a wafer is rinsed in a liquid bath and subsequently exposed to a chemically reactive additive. The chemically reactive additive creates a surface tension gradient that physically and chemically alters the properties of the film of the rinse liquid so that the liquid and any contaminants contained therein are removed from the water surface.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2003</creationdate><recordtype>patent</recordtype><sourceid>EFH</sourceid><recordid>eNqNjEsKAjEQRLNxIeod-gKCEhnXIooHcONqaDI9Y2N-dJIRb28CHsBVFdSrt1SPU4womEuCMQgIuTCzn8AEn9GxR5_rIsEBwjvIKzIZgpIag2Ce5NigtZ_6RJN5JsBh4FbWajGiTbT55UrB9XI_37YlRcxUvf0kTd_vuk4f9HGv_0C-4mk8FQ</recordid><startdate>20031021</startdate><enddate>20031021</enddate><creator>Gaylord, III, Richard Hilliard</creator><creator>Kern, Jr., Frederick William</creator><creator>Martin, Donald Joseph</creator><creator>Okorn-Schmidt, Harald Franz</creator><creator>Snyder, John Joseph</creator><creator>Syverson, William Alfred</creator><scope>EFH</scope></search><sort><creationdate>20031021</creationdate><title>Apparatus for removing contaminants from a workpiece using a chemically reactive additive</title><author>Gaylord, III, Richard Hilliard ; Kern, Jr., Frederick William ; Martin, Donald Joseph ; Okorn-Schmidt, Harald Franz ; Snyder, John Joseph ; Syverson, William Alfred</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-uspatents_grants_066343713</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2003</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Gaylord, III, Richard Hilliard</creatorcontrib><creatorcontrib>Kern, Jr., Frederick William</creatorcontrib><creatorcontrib>Martin, Donald Joseph</creatorcontrib><creatorcontrib>Okorn-Schmidt, Harald Franz</creatorcontrib><creatorcontrib>Snyder, John Joseph</creatorcontrib><creatorcontrib>Syverson, William Alfred</creatorcontrib><creatorcontrib>International Business Machines Corporation</creatorcontrib><collection>USPTO Issued Patents</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gaylord, III, Richard Hilliard</au><au>Kern, Jr., Frederick William</au><au>Martin, Donald Joseph</au><au>Okorn-Schmidt, Harald Franz</au><au>Snyder, John Joseph</au><au>Syverson, William Alfred</au><aucorp>International Business Machines Corporation</aucorp><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Apparatus for removing contaminants from a workpiece using a chemically reactive additive</title><date>2003-10-21</date><risdate>2003</risdate><abstract>1. Technical Field
An apparatus for drying one or more workpieces. The apparatus includes the use of a chemically reactive additive to remove contaminants from the wafer surface during processing. In particular, during processing, a wafer is rinsed in a liquid bath and subsequently exposed to a chemically reactive additive. The chemically reactive additive creates a surface tension gradient that physically and chemically alters the properties of the film of the rinse liquid so that the liquid and any contaminants contained therein are removed from the water surface.</abstract><oa>free_for_read</oa></addata></record> |
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title | Apparatus for removing contaminants from a workpiece using a chemically reactive additive |
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