Apparatus for removing contaminants from a workpiece using a chemically reactive additive

1. Technical Field An apparatus for drying one or more workpieces. The apparatus includes the use of a chemically reactive additive to remove contaminants from the wafer surface during processing. In particular, during processing, a wafer is rinsed in a liquid bath and subsequently exposed to a chem...

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Bibliographische Detailangaben
Hauptverfasser: Gaylord, III, Richard Hilliard, Kern, Jr., Frederick William, Martin, Donald Joseph, Okorn-Schmidt, Harald Franz, Snyder, John Joseph, Syverson, William Alfred
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
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Beschreibung
Zusammenfassung:1. Technical Field An apparatus for drying one or more workpieces. The apparatus includes the use of a chemically reactive additive to remove contaminants from the wafer surface during processing. In particular, during processing, a wafer is rinsed in a liquid bath and subsequently exposed to a chemically reactive additive. The chemically reactive additive creates a surface tension gradient that physically and chemically alters the properties of the film of the rinse liquid so that the liquid and any contaminants contained therein are removed from the water surface.