Wafer trench article and process

This invention relates generally to semiconductor wafer processing and, in particular, to processes that form trenches in wafers while reducing device stress and defects. A bonded wafer has a device substrate with isolation trenches defining device regions Oxide dogbone structures are removed before...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Begley, Patrick Anthony, Hemmenway, Donald Frank, Bajor, George, Rivoli, Anthony Lee, McNamara, Jeanne Marie, Carmody, Michael Sean, Woodbury, Dustin Alexander
Format: Patent
Sprache:eng
Online-Zugang:Volltext bestellen
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Beschreibung
Zusammenfassung:This invention relates generally to semiconductor wafer processing and, in particular, to processes that form trenches in wafers while reducing device stress and defects. A bonded wafer has a device substrate with isolation trenches defining device regions Oxide dogbone structures are removed before filling trenches . Voids in the trenches are spaced from the top of the trenches. The trenches are covered with an oxide layer and filled with polysilicon A LOCOS mask structure comprising a layer of CVD pad oxide and silicon nitride cover the trenches and the adjacent device substrate regions.