X-ray fluorescence analysis apparatus
The present invention relates to a fluorescent X-ray analysis apparatus for detecting secondary X-rays generated by a sample during irradiation with X-rays and carrying out elementary analysis. An X-ray fluorescence analysis apparatus in which a collimator for defining a range of passage of X-rays,...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | The present invention relates to a fluorescent X-ray analysis apparatus for detecting secondary X-rays generated by a sample during irradiation with X-rays and carrying out elementary analysis.
An X-ray fluorescence analysis apparatus in which a collimator for defining a range of passage of X-rays, can be safely and simply attached and detached by providing a right-hand screw thread for attachment of the collimator to a housing, an X-ray generator, or an X-ray detector, and further providing a left-hand screw thread on a side of the collimator opposite to that of the right-hand screw thread. An attachment jig having a left-hand screw thread corresponding to the left-hand screw thread provided on the collimator is used to attach and detach the collimator. |
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